XRD2DScan 3.23 (New): A SOFTWARE FOR
POLYCRYSTALLINE MATERIALS CHARACTERIZATION USING TWO-DIMENSIONAL X-RAY
DIFFRACTION
XRD2DScan is a Windows software tool for displaying and analyzing two-dimensional (2D) X-ray diffraction patterns or frames collected using a diffractometer equipped with a 2D or area detector (Image plate, CCD, Multy-wire). Two-dimensional diffraction patterns contains a wealth of information regarding the mineralogical composition and microstructure of polycrystalline materials. Our software can generate different types of scans (2Theta scan, Psi scan, d-spacing versus Psi angle) allowing users to extract the maximum information from the original 2D patterns. It can be used for mineral phase identification and microstructure (preferential orientation, pole figures, grain size and stress) analyses. It allows the automatic analyses of a large number of 2D patterns using batch processing. To explore these and other features of the last version of the software (New version 3.23) please download it here or by clicking the image below. For further inquires about the software please contact the author (Dr. Alejandro Rodriguez Navarro; E-mail: anava@ugr.es).
"Use your X-ray single-crystal diffractometer as an Advanced Materials Research / Powder diffractometer with our software"
Main features of XRD2DScan software ( New version 3.23 modified on September 4, 2008 )
Automatic recognition of Bruker (SMART APEX, GADDS, PROTEUM), Oxford Diffraction (SAPPHIRE), Mar Research, ADSC, Rigaku RMax Rapid (NEW v3.0), Nonius KCCD (New 3.21), TIFF, BMP (New) data file formats from 256 x 256 to 2500 x 2500 pixels in size. In case you need other formats please contact the author.
Compatible with Flat or Cylindrical (Debye-Scherrer or Guinier cameras) detectors (NEW v3.0).
Multiple configuration for different diffractometer settings (New v3.0)
2Theta and Psi scans from selected pixels within an angular or rectangular sector. Compatible with Xpowder, JADE (MDI) and EVA (Bruker) X-ray diffraction analysis software. (New)
X and Y line scans allowing multiple parameters determination (wavelength, distance to detector, detector size, direct beam coordinates; New v 3.20) using a standard.
Several Masking tools implemented including an automatic tool that search and mask single crystal reflections (New v3.23).
d-spacing as a function of Psi angle for selected Debye ring.
5 different centering procedures implemented.
Automatic background, peak search and peak integration in 2Theta and Psi scans.
Addition and substraction of 2D patterns
Logbook reporting all user actions and processed information
History window showing last loaded frames. (New)
Mineral database and automatic identification tool. (New)
Batch processing of an unlimited number of files
Pole figure generation and analysis tool (New).
It allows the use of modern single-crystal diffractometers equipped with area detectors as sophisticated material research / powder diffractometers.
Custom features can be develop upon request.
Operating system: Windows 98, 2000, XP and Vista (New).
Important information
Download XRD2DScan v3.23 Installation software (New version fully renovated with more options and compatible with Cylindrical (Debye-Scherrer) detectors) (updated on August 10, 2008)
Download user manual of XRD2DScan 3.23 including useful examples and applications.(New version) (updated on July 7, 2008)
Gallery and some useful features. For additional ones see the user manual..
For license information contact us: (Dr. Alejandro Rodriguez Navarro; E-mail: anava@ugr.es).
BEFORE INSTALLING XRD2DScan software, please consider the following:
If you experience problems installing the software, please report them to the author (Email: anava@ugr.es)