XRD2DScan 3.23 (New): A SOFTWARE FOR POLYCRYSTALLINE MATERIALS CHARACTERIZATION USING TWO-DIMENSIONAL X-RAY DIFFRACTION

             XRD2DScan is a Windows software tool for displaying and analyzing two-dimensional (2D) X-ray diffraction patterns or frames collected using a diffractometer equipped with a 2D or area detector (Image plate, CCD, Multy-wire).  Two-dimensional diffraction patterns contains a wealth of information regarding the mineralogical composition and microstructure of polycrystalline materials. Our software can generate different types of scans (2Theta scan, Psi scan, d-spacing versus Psi angle) allowing users to extract the maximum information from the original 2D patterns. It can be used for mineral phase identification and microstructure (preferential orientation, pole figures, grain size and stress) analyses. It allows the automatic analyses of a large number of 2D patterns using batch processing. To explore these and other features of the last version of the software (New version 3.23) please download it here or by clicking the image below. For further inquires about the software please contact the author (Dr. Alejandro Rodriguez Navarro; E-mail: anava@ugr.es).

 

"Use your X-ray single-crystal diffractometer as an Advanced Materials Research / Powder diffractometer with our software"

Main features of XRD2DScan software ( New version 3.23 modified on September 4, 2008 )

Important information

    Web page last updated on June 15,  2009